| DOI | Resolve DOI: https://doi.org/10.1016/j.ultramic.2008.07.004 |
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| Author | Search for: Malac, Marek1; Search for: Beleggia, Marco; Search for: Taniguchi, Yoshifumi; Search for: Egerton, Ray F.1; Search for: Zhu, Yimei |
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| Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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| Format | Text, Article |
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| Subject | electron diffraction; low-dosemicroscopy; radiation damage; TEM imaging; phase contrast; nanoparticle |
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| Abstract | Weevaluatethelow-doseperformanceofparallelnano-beamdiffraction(NBD)inthetransmission electron microscopeasamethodforcharacterizingradiationsensitivematerialsatlowelectron irradiation dose.Acriterion,analogoustoRose’s,isestablishedfordetectingadiffractionspotwith desired signal-to-noiseratio.Ourexperimentaldatashowthatadosesubstantiallylowerthaninhigh- resolution bright-fieldimagingissufficienttodeterminestructureandorientationofindividual nanoscaleobjectsembeddedinamorphousmatrix.Inaninstrumentequippedwithacoldfield- emissiongunitispossibletoformaprobewithsub-3nmdiameterandsub-0.3mradconvergenceangle with sufficientbeamcurrenttorecordadiffractionpatternwithlessthan0.2sacquisitiontime.The interpretationofNBDpatternsisidenticaltothatofselectedareadiffractionpatterns.Weillustratethe physicalprinciplesunderlyinggoodlow-doseperformanceofNBDbymeansofaphasegrating.The electron irradiationdoseneededtodetectadiffractionpeakinNBDisfoundproportionalto1/N2, where N is thenumberoflatticeplanescontributingtothepeak. |
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| Publication date | 2008-07 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21268180 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | d2de9766-196b-4ab4-923c-279f6919d442 |
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| Record created | 2013-05-21 |
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| Record modified | 2020-04-15 |
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