Characterization of the internal morphology of organic devices by Focused Ion Beam (FIB) and transmission electron microscopy (TEM)
Characterization of the internal morphology of organic devices by Focused Ion Beam (FIB) and transmission electron microscopy (TEM)
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| Format | Text, Address |
| Conference | Microscopical Society of Canada Annual Meeting, June 19-21, 2013, Victoria, British Columbia, Canada |
| Publication date | ca 2013-06-21 |
| Language | English |
| Export citation | Export as RIS |
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| Record identifier | d83a737a-2b07-4eea-ad64-3baf1b56017f |
| Record created | 2021-08-26 |
| Record modified | 2023-03-15 |
- Date modified: