High extinction ratio and broadband silicon TE-pass polarizer using subwavelength grating index engineering

From National Research Council Canada

Download	View accepted manuscript: High extinction ratio and broadband silicon TE-pass polarizer using subwavelength grating index engineering (PDF, 781 KB)
DOI	Resolve DOI: https://doi.org/10.1109/JPHOT.2015.2483204
Author	Search for: Xiong, Yule¹; Search for: Xu, Dan-Xia¹; Search for: Schmid, Jens H.¹; Search for: Cheben, Pavel¹ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: Ye, Winnie N.
Name affiliation	National Research Council Canada. Information and Communication Technologies
Format	Text
Type	Article
Journal title	IEEE Photonics Journal
ISSN	1943-0655
Subject	waveguides; subwavelength structures; silicon nanophotonics
Abstract	We propose and experimentally demonstrate a novel approach to implement a low loss, broadband and compact transverse electric (TE)-pass polarizer on a silicon-on-insulator (SOI) platform. The TE-polarizer utilizes a subwavelength grating (SWG) structure to engineer the waveguide equivalent material index. In this work, the SWG-based polarizer only supports its fundamental TE mode while the transverse magnetic (TM) mode is suppressed under the cut-off condition, i.e., the TM mode leaks from the waveguide with a low reflection. The simulations predict that the bandwidth to achieve a polarization extinction ratio (ER) of 35 dB exceeds 200 nm. Experimentally, the measured polarization ER is ~30 dB and the average insertion loss is 0.4 dB, in the wavelength range 1470 nm - 1580 nm. The fabricated TE-polarizer has a compact length of 60 μm.
Publication date	2015-10-01
Language	English
Peer reviewed	Yes
NPARC number	21276377
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Record identifier	dc22c28e-4d99-439d-a176-076389f9bf5b
Record created	2015-10-07
Record modified	2020-02-14

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Date modified:: 2020-02-26