| DOI | Resolve DOI: https://doi.org/10.1017/S1431927612004278 |
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| Author | Search for: Malac, Marek1; Search for: Bergen, Michael1; Search for: Egerton, Ray1; Search for: Kawasaki, Masahiro; Search for: Beleggia, Marco; Search for: Furukawa, H.; Search for: Shimizu, M. |
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| Affiliation | - National Research Council of Canada. Nanotechnology
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| Format | Text, Article |
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| Conference | Microscopy & Microanalysis 2012, July 29 - August 2, 2012, Phoenix, Arizona, United States |
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| Abstract | Hole-free phase plate (HFPP) imaging in a TEM requires a few simple steps to implement [1,2] and a limited number of experimental parameters to be controlled. Although the implementation and operation of the HFPP is easy, there are potential pitfalls, such as selecting suitable size HFPP support aperture, allowing the HFPP to settle before image acquisition, focusing the back focal plane on the HFPP film and monitoring the live FFT of image for artifacts. We will show how to implement a HFPP and ways to identify and circumvent the pitfalls. |
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| Publication date | 2012-07 |
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| Publisher | Cambridge University Press |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | e25cd792-71d5-431c-a1ad-865bc8395cab |
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| Record created | 2020-01-23 |
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| Record modified | 2024-05-15 |
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