| Download | - View accepted manuscript: Inelastic light scattering spectroscopy in si/SiGe nanostructures: strain, chemical composition and thermal properties (PDF, 1018 KiB)
|
|---|
| DOI | Resolve DOI: https://doi.org/10.1016/j.ssc.2016.07.008 |
|---|
| Author | Search for: Tsybeskov, L.; Search for: Mala, S. A.; Search for: Wang, X.; Search for: Baribeau, J.-M.1; Search for: Wu, X.1; Search for: Lockwood, D. J.2 |
|---|
| Affiliation | - National Research Council of Canada. Information and Communication Technologies
- National Research Council of Canada. Measurement Science and Standards
|
|---|
| Format | Text, Article |
|---|
| Subject | Nanostructures; Molecular Beam Epitaxy; Inelastic Light Scattering; Raman Scattering |
|---|
| Abstract | We present a review of recent studies of inelastic light scattering spectroscopy in two types of Si/SiGe nanostructures: planar superlattices and cluster (dot) multilayers including first- and second-order Raman scattering, polarized Raman scattering and low-frequency inelastic light scattering associated with folded acoustic phonons. The results are used in semi-quantitative analysis of chemical composition, strain and thermal conductivity in these technologically important materials for electronic and optoelectronic devices. |
|---|
| Publication date | 2016-07-09 |
|---|
| Publisher | Elsevier |
|---|
| In | |
|---|
| Language | English |
|---|
| Peer reviewed | Yes |
|---|
| NPARC number | 23000477 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | e7469215-77b6-45da-b380-175305bd4da2 |
|---|
| Record created | 2016-07-22 |
|---|
| Record modified | 2021-10-14 |
|---|
