| Author | Search for: Malac, Marek1; Search for: Wang, Carol1; Search for: Egerton, Ray1 |
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| Affiliation | - National Research Council of Canada. Security and Disruptive Technologies
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| Format | Text, Address |
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| Conference | Presented at the Center for Functional Nanomaterials, Brookhaven National Laboratory, May 21st, 2012, Upton, New York |
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| Abstract | Electron energy loss spectroscopy (EELS) has become a mainstream characterization method. It provides access to high spatial resolution analytical and electronic properties information in a TEM. When combined with the imaging and diffraction capabilities of a TEM a nanomaterial can be characterized in great detail. The aim is to review the principles and implementation of angle- and spatially-resolved EELS and its applications to study of material properties at nanoscale. Fundamental limits imposed on momentum and spatial resolution will be discussed. |
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| Publication date | 2012-05-21 |
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| Language | English |
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| Peer reviewed | No |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | e8794421-2cff-40fa-aba2-425e585a9bb6 |
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| Record created | 2020-10-15 |
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| Record modified | 2020-10-15 |
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