Principles and applications of angle and spatially resolved EELS

Auteur	Rechercher : Malac, Marek¹; Rechercher : Wang, Carol¹; Rechercher : Egerton, Ray¹
Affiliation	Conseil national de recherches du Canada. Technologies de sécurité et de rupture
Format	Texte, Allocution
Conférence	Presented at the Center for Functional Nanomaterials, Brookhaven National Laboratory, May 21st, 2012, Upton, New York
Résumé	Electron energy loss spectroscopy (EELS) has become a mainstream characterization method. It provides access to high spatial resolution analytical and electronic properties information in a TEM. When combined with the imaging and diffraction capabilities of a TEM a nanomaterial can be characterized in great detail. The aim is to review the principles and implementation of angle- and spatially-resolved EELS and its applications to study of material properties at nanoscale. Fundamental limits imposed on momentum and spatial resolution will be discussed.
Date de publication	2012-05-21
Langue	anglais
Publications évaluées par des pairs	Non
Exporter la notice	Exporter en format RIS
Signaler une correction	Signaler une correction (s'ouvre dans un nouvel onglet)
Identificateur de l’enregistrement	e8794421-2cff-40fa-aba2-425e585a9bb6
Enregistrement créé	2020-10-15
Enregistrement modifié	2020-10-15