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Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic Devices

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1080/10408430590952523
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  • Critical Reviews in Solid State and Material Sciences 30, no. 2 (2005): 71–124.
NPARC number12743830
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Record identifiere97a6357-094a-4e44-b15e-a06425b99fb4
Record created2009-10-27
Record modified2020-04-07
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