Download | - View accepted manuscript: Hot Embossing Lithography: Release-Layer Characterization by Chemical Force Microscopy (PDF, 545 KiB)
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Author | Search for: Cameron, Neil1; Search for: Ott, Arnaud1; Search for: Roberge, Hélène1; Search for: Veres, Teodor1 |
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Affiliation | - National Research Council of Canada. NRC Industrial Materials Institute
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Format | Text, Address |
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Conference | MRS Spring Meeting, San Francisco, California, March 28-April 01, 2005 |
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Publication date | 2005-03-28 |
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Language | English |
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Peer reviewed | Yes |
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NRC number | NRCC 47933 |
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NPARC number | 15966876 |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | f69d2f7a-5d6c-4730-902f-4a1b8ccfe139 |
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Record created | 2010-10-05 |
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Record modified | 2020-03-03 |
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