Infrared ellipsometry of GaAs epilayers on Si(100)
Infrared ellipsometry of GaAs epilayers on Si(100)
DOI | Resolve DOI: https://doi.org/10.1063/1.1561577 |
---|---|
Author | Search for: ; Search for: ; Search for: ; Search for: |
Format | Text, Article |
Publication date | 2003-03-17 |
In | |
Language | English |
NRC number | NRC-INMS-352 |
NPARC number | 8896488 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | fe858d36-4abc-4934-8be2-9e3d428c94dd |
Record created | 2009-04-22 |
Record modified | 2020-04-02 |
- Date modified: