| DOI | Trouver le DOI : https://doi.org/10.1103/PhysRevB.70.214406 |
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| Auteur | Rechercher : Fritzsche, H.1; Rechercher : Liu, Y. T.; Rechercher : Hauschild, J.; Rechercher : Maletta, H. |
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| Affiliation | - Conseil national de recherches du Canada. Institut Steacie des sciences moléculaires du CNRC
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| Format | Texte, Article |
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| Résumé | We used polarized neutron reflectometry (PNR) to determine the absolute magnetic moment of uncovered and V-covered Fe films in the thickness range from 0.3 to 5.5 nm . The films were prepared by molecular beam epitaxy on a V(100) buffer layer grown on a MgO(100) crystal. The magnetic moment shows a linear dependence on the Fe film thickness with a reduction (compared to the Fe bulk value) of the magnetic moment equivalent to 0.1 nm bulk Fe for the V-covered films and a reduction equivalent to 0.03 nm bulk Fe for the uncovered Fe films. For the case of the V/Fe/V samples we observe a much smaller reduction of the magnetic moment than reported for experiments on Fe/V multilayers. As theoretical calculations show a strong decrease of the magnetic moment for an interface alloy we conclude that the larger reduction of the magnetization in Fe/V multilayers is due to an increase in interface roughness with increasing film thickness. For the uncovered Fe(100) films we find a much smaller reduction of the magnetic moment than in earlier in situ PNR experiments on V (110) /Fe (110) where we observed a reduction equivalent to 0.4 nm bulk Fe. |
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| Date de publication | 2004-12-06 |
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| Maison d’édition | American Physical Society |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 12329220 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | c8ea0666-9d2b-48f3-870b-76e29ea8f67f |
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| Enregistrement créé | 2009-09-10 |
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| Enregistrement modifié | 2023-06-23 |
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